发明名称 Process for cleaning, drying and hydrophilizing a semiconductor wafer
摘要 Semiconductor wafers are cleaned, dried, and hydrophilized the following steps in the order stated: a) treating the semiconductor wafer with a liquid aqueous solution containing hydrogen fluoride, the semiconductor wafer rotating about its center axis at least occasionally, andb) drying the semiconductor wafer by rotation of the semiconductor wafer about its center axis at a rotational speed of 1000 to 5000 revolutions per minute in an ozone-containing atmosphere, the liquid aqueous solution containing hydrogen fluoride flowing away from the semiconductor wafer on account of the centrifugal force generated by the rotation, and the surface of the semiconductor wafer being hydrophilized by ozone.
申请公布号 US9230794(B2) 申请公布日期 2016.01.05
申请号 US200812134378 申请日期 2008.06.06
申请人 SILTRONIC AG 发明人 Schwab Guenter;Zapilko Clemens;Buschhardt Thomas;Feijoo Diego
分类号 H01L21/02;C30B29/16;C30B33/00 主分类号 H01L21/02
代理机构 Brooks Kushman P.C. 代理人 Brooks Kushman P.C.
主权项 1. A process for cleaning, drying and hydrophilizing a semiconductor wafer, comprising the following steps in the order stated: a) applying a liquid aqueous solution containing hydrogen fluoride onto the semiconductor wafer while the semiconductor wafer is caused to rotate about its center axis at least occasionally, so that the liquid aqueous solution containing hydrogen fluoride flows away outwards and forms a continuous liquid film on the semiconductor wafer, and b) directly following step a), completely drying the semiconductor wafer by rotation of the semiconductor wafer about its center axis at a rotational speed of 1000 to 5000 revolutions per minute in an ozone-containing atmosphere having a concentration of ozone of 5 to 20 percent by weight, the liquid aqueous solution containing hydrogen fluoride flowing away from the semiconductor wafer on account of the centrifugal force generated by the rotation, and the surface of the semiconductor wafer being hydrophilized by ozone, wherein the semiconductor wafer is exposed to the ozone-containing atmosphere starting from a point in time at which the semiconductor wafer is still covered with the continuous liquid film, and continues until the semiconductor wafer is completely dry.
地址 Munich DE