发明名称 |
CHEMICAL MECHANICAL POLISHING METHOD |
摘要 |
A chemical mechanical polishing method of a substrate is provided. The method comprises the following steps of: providing a polishing machine having a platen; providing a substrate having an exposed silicon oxide surface; providing a chemical mechanical polishing pad comprising a polyurethane polishing layer wherein the polyurethane polishing layer composition exhibits an acid number of 0.5 mg (KOH)/g or higher; providing an abrasive slurry comprising water and a ceria abrasive; generating dynamic contact at an interface between the chemical mechanical polishing pad and the substrate; dispensing the abrasive slurry onto a polishing surface of the polyurethane polishing layer of the chemical mechanical polishing pad at or near the interface between the chemical mechanical polishing pad and the substrate; and polishing the substrate. |
申请公布号 |
KR20160000855(A) |
申请公布日期 |
2016.01.05 |
申请号 |
KR20150088246 |
申请日期 |
2015.06.22 |
申请人 |
ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC.;DOW GLOBAL TECHNOLOGIES LLC |
发明人 |
QIAN BAINIAN;DEGROOT MARTY;SONNENSCHEIN MARK F. |
分类号 |
H01L21/304;H01L21/02 |
主分类号 |
H01L21/304 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|