发明名称 CHEMICAL MECHANICAL POLISHING METHOD
摘要 A chemical mechanical polishing method of a substrate is provided. The method comprises the following steps of: providing a polishing machine having a platen; providing a substrate having an exposed silicon oxide surface; providing a chemical mechanical polishing pad comprising a polyurethane polishing layer wherein the polyurethane polishing layer composition exhibits an acid number of 0.5 mg (KOH)/g or higher; providing an abrasive slurry comprising water and a ceria abrasive; generating dynamic contact at an interface between the chemical mechanical polishing pad and the substrate; dispensing the abrasive slurry onto a polishing surface of the polyurethane polishing layer of the chemical mechanical polishing pad at or near the interface between the chemical mechanical polishing pad and the substrate; and polishing the substrate.
申请公布号 KR20160000855(A) 申请公布日期 2016.01.05
申请号 KR20150088246 申请日期 2015.06.22
申请人 ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC.;DOW GLOBAL TECHNOLOGIES LLC 发明人 QIAN BAINIAN;DEGROOT MARTY;SONNENSCHEIN MARK F.
分类号 H01L21/304;H01L21/02 主分类号 H01L21/304
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