| 发明名称 |
APPARATUS AND METHOD FOR A USER CONFIGURABLE RELIABILITY CONTROL LOOP |
| 摘要 |
An apparatus and method for a user configurable reliability control loop. For example, one embodiment of a processor comprises: a reliability meter to track accumulated stress on components of the processor based on measured processor operating conditions; and a controller to receive stress rate limit information from a user or manufacturer and to responsively specify a set of N operating limits on the processor in accordance with the accumulated stress and the stress rate limit information; and performance selection logic to output one or more actual operating conditions for the processor based on the N operating limits specified by the controller. |
| 申请公布号 |
US2015377955(A1) |
申请公布日期 |
2015.12.31 |
| 申请号 |
US201414319197 |
申请日期 |
2014.06.30 |
| 申请人 |
Intel Corporation |
发明人 |
Shapira Dorit;Sistla Krishnakanth V.;Rotem Efraim;Distefano Eric;Hermerding, II James G.;Natanzon Esfir |
| 分类号 |
G01R31/26;G06F11/30;G06F11/34 |
主分类号 |
G01R31/26 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A processor comprising:
a reliability meter to track accumulated stress on components of the processor based on measured processor operating conditions; a controller to receive stress rate limit information from a user or manufacturer and to responsively specify a set of N operating limits on the processor in accordance with the accumulated stress and the stress rate limit information; and performance selection logic to output one or more actual operating conditions for the processor based on the N operating limits specified by the controller. |
| 地址 |
Santa Clara CA US |
