发明名称 Defect Classification And Association In A Software Development Environment
摘要 Defect classification and association in a software development environment. The embodiments herein relates to a software development environment, and more particularly to managing defects in a software development environment. The defect management engine may use information present in the code repository to create a master list of features and/or sub-features. Using the master list, the defect management engine may scan and parse all reported defects (which may be present in the defect repository The defect management engine may associate defects with features present in the master list. The defect management engine may then extract the test cases and map the test cases to the defects. The defect management engine may determine the test coverage metric and the test case sufficiency metric. The defect management engine may also label unmapped defects as orphan defects.
申请公布号 US2015378874(A1) 申请公布日期 2015.12.31
申请号 US201414510114 申请日期 2014.10.09
申请人 Prasad Dhanyamraju S U M;Prakash K Satya Sai;Chacko Simy;Ramaraju Sekhar;Pabba Sankar 发明人 Prasad Dhanyamraju S U M;Prakash K Satya Sai;Chacko Simy;Ramaraju Sekhar;Pabba Sankar
分类号 G06F11/36 主分类号 G06F11/36
代理机构 代理人
主权项 1. A method for managing defects in a software development environment, the method comprising of creating a master list of features by a defect management engine using information fetched from a code repository; mapping defects to most probable feature from the master list by the defect management engine, wherein the defects are fetched from a defect repository; mapping test cases to the defects by the defect management engine; labelling unmapped defects as orphan defects by the defect management engine; labelling mapped defects as mapped defects by the defect management engine; calculating test coverage metric by the defect management engine as Test Coverage metric=(Number of Test Cases Executed/Total number of Test Cases)*100; and calculating test case sufficiency metric by the defect management engine as Test Case Sufficiency={1=(Number of mapped defects for a feature/total defects)}*100
地址 Hyderabad IN