发明名称 |
ELECTRO-OPTICAL DEVICE, METHOD OF MEASURING CHARACTERISTICS OF ELECTRO-OPTICAL DEVICE, AND SEMICONDUCTOR CHIP |
摘要 |
An electro-optical device includes: a display unit having a plurality of pixel circuits each including a driving transistor and a light emitting element that emits light depending on a current output from the driving transistor when a voltage is applied to a gate terminal of the driving transistor; and a test unit having a test unit connection switch connected to the gate terminal of the driving transistor of each of the pixel circuits, and a test voltage supply circuit connected to the gate terminal of each of the driving transistors through the test unit connection switch and configured to supply a test voltage to the gate terminal of each of the driving transistors when the test unit connection switch is turned on. |
申请公布号 |
US2015379910(A1) |
申请公布日期 |
2015.12.31 |
申请号 |
US201514746988 |
申请日期 |
2015.06.23 |
申请人 |
Rohm Co., Ltd. |
发明人 |
Nishinohara Daisuke;Maruo Akimasa |
分类号 |
G09G3/00;G09G3/32 |
主分类号 |
G09G3/00 |
代理机构 |
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代理人 |
|
主权项 |
1. An electro-optical device, comprising:
a display unit having a plurality of pixel circuits each including a driving transistor and a light emitting element that emits light depending on a current output from the driving transistor when a voltage is applied to a gate terminal of the driving transistor; and a test unit having a test unit connection switch connected to the gate terminal of the driving transistor of each of the pixel circuits, and a test voltage supply circuit connected to the gate terminal of each of the driving transistors through the test unit connection switch and configured to supply a test voltage to the gate terminal of each of the driving transistors when the test unit connection switch is turned on. |
地址 |
Kyoto JP |