发明名称 METHOD AND APPARATUS FOR ENHANCED DETECTION OF DISCONTINUITIES IN THE SURFACE OF A SUBSTRATE
摘要 According to a preferable embodiment of the present invention, a method for an enhanced detection of discontinuities on a surface of a substrate comprises: performing a first review in regards to an existing bad sector in a preset distance or/and a preset angle relative to the bad sector; and then searching an additional peripheral region to determine if a micro-defect exists, performing a second review. Following this, connect the first bad sector and the second bad sector, and perform a complement procedure.
申请公布号 KR20150146276(A) 申请公布日期 2015.12.31
申请号 KR20140076637 申请日期 2014.06.23
申请人 SAMSUNG TECHWIN CO., LTD. 发明人 KIM, JI HO;CHA, JUN HO;JEONG, JAE HO
分类号 G01N21/88;G06T7/00 主分类号 G01N21/88
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