发明名称 |
METHOD AND APPARATUS FOR ENHANCED DETECTION OF DISCONTINUITIES IN THE SURFACE OF A SUBSTRATE |
摘要 |
According to a preferable embodiment of the present invention, a method for an enhanced detection of discontinuities on a surface of a substrate comprises: performing a first review in regards to an existing bad sector in a preset distance or/and a preset angle relative to the bad sector; and then searching an additional peripheral region to determine if a micro-defect exists, performing a second review. Following this, connect the first bad sector and the second bad sector, and perform a complement procedure. |
申请公布号 |
KR20150146276(A) |
申请公布日期 |
2015.12.31 |
申请号 |
KR20140076637 |
申请日期 |
2014.06.23 |
申请人 |
SAMSUNG TECHWIN CO., LTD. |
发明人 |
KIM, JI HO;CHA, JUN HO;JEONG, JAE HO |
分类号 |
G01N21/88;G06T7/00 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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