发明名称 |
CHAMBER APPARATUS FOR CHEMICAL ETCHING OF DIELECTRIC MATERIALS |
摘要 |
Implementations of the disclosure generally provide an improved pedestal heater for a processing chamber. The pedestal heater includes a temperature-controlled plate having a first surface and a second surface opposing the first surface. The temperature-controlled plate includes an inner zone comprising a first set of heating elements, an outer zone comprising a second set of heating elements, the outer zone surrounding the inner zone, and a continuous thermal choke disposed between the inner zone and the outer zone, and a substrate receiving plate having a first surface and a second surface opposing the first surface, the second surface of the substrate receiving plate is coupled to the first surface of the temperature-controlled plate. The continuous thermal choke enables a very small temperature gradient to be created and manipulated between the inner zone and the outer zone, allowing center-fast or edge-fast etching profile to achieve on a surface of the substrate. |
申请公布号 |
US2015380220(A1) |
申请公布日期 |
2015.12.31 |
申请号 |
US201514747367 |
申请日期 |
2015.06.23 |
申请人 |
Applied Materials, Inc. |
发明人 |
TAN Tien Fak;LUBOMIRSKY Dmitry;FLOYD Kirby H.;NGUYEN Son T.;PALAGASHVILI David;TAM Alexander;CHEN Shaofeng |
分类号 |
H01J37/32 |
主分类号 |
H01J37/32 |
代理机构 |
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代理人 |
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主权项 |
1. A pedestal heater for a processing chamber, comprising:
a temperature-controlled plate having a first surface and a second surface opposing the first surface, comprising:
a first zone comprising a first set of heating elements;a second zone comprising a second set of heating elements, the second zone surrounding the first zone; anda continuous annular thermal choke disposed between the first zone and the second zone; and a substrate receiving plate having a first surface and a second surface opposing the first surface, the second surface of the substrate receiving plate is coupled to the first surface of the temperature-controlled plate. |
地址 |
Santa Clara CA US |