| 发明名称 |
APPARATUSES AND METHODS FOR MEMORY TESTING AND REPAIR |
| 摘要 |
Some embodiments include apparatuses and methods having a first interface to communicate with a processing unit, a second interface to communicate with a memory device, and a module coupled to the first and second interfaces. In at least one of the embodiments, the module can be configured to obtain information stored in the memory device and perform at least one of testing and repairing of a memory structure of the memory device based at least in part on the information. |
| 申请公布号 |
US2015380109(A1) |
申请公布日期 |
2015.12.31 |
| 申请号 |
US201514790485 |
申请日期 |
2015.07.02 |
| 申请人 |
Micron Technology, Inc. |
发明人 |
Jeddeloh Joe M.;Keeth Brent |
| 分类号 |
G11C29/44;G06F11/10;G11C29/00;G06F11/07 |
主分类号 |
G11C29/44 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An apparatus comprising:
a first interface to communicate with a processing unit; a second interface to communicate with a memory device; and a module coupled to the first and second interfaces and configured to obtain test information stored in the memory device and perform a testing of a memory structure of the memory device based at least in part on the test information. |
| 地址 |
Boise ID US |
