发明名称 DYNAMIC LIGHT SCATTERING MEASUREMENT DEVICE AND DYNAMIC LIGHT SCATTERING MEASUREMENT METHOD
摘要 The present invention relates to a dynamic light scattering measurement device, which is not influenced by disturbance such as vibration, and is not necessary to adjust gap of a light path between a reference light and a sample light. The dynamic light scattering measurement device (1) comprises: an irradiation unit which irradiates light from a low-coherence light source (10) to a sample (40) including particles (42); a spectral intensity acquiring unit which acquires spectral intensity of reflective light, scattered light and interference light by a spectrum of the scattered light from the sample (40) which passes through the reference plane; and a measuring unit which measures the dynamic light scattering of the sample (40) based on the acquired spectral intensity.
申请公布号 KR20150146415(A) 申请公布日期 2015.12.31
申请号 KR20150085841 申请日期 2015.06.17
申请人 오츠카 일렉트로닉스 가부시키가이샤;고꾸리쯔 다이가꾸호우징 도쿄노우코우다이가쿠 发明人 이즈타니 유스케;이와이 도시아키
分类号 G01N15/02;G01N21/31;G01N21/47 主分类号 G01N15/02
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