发明名称 CIRCUIT BOARD AND METHOD FOR PLACEMENT STATE TEST OF ELECTRIC COMPONENT USING THE SAME
摘要 The present invention relates to a circuit board and a method for testing a placement state of an electronic component by using the same. According to an embodiment of the present invention, the circuit board comprises: a first pad; a second pad formed separately from the first pad; and a bonding pad on which an electronic component is mounted.
申请公布号 KR20150146293(A) 申请公布日期 2015.12.31
申请号 KR20140076691 申请日期 2014.06.23
申请人 삼성전기주식회사 发明人 김창현;조경석
分类号 H05K1/18;H05K13/08 主分类号 H05K1/18
代理机构 代理人
主权项
地址