发明名称 |
TUNGSTEN CHEMICAL-MECHANICAL POLISHING COMPOSITION |
摘要 |
A chemical-mechanical polishing composition includes colloidal silica abrasive particles having a chemical compound incorporated therein. The chemical compound may include a nitrogen-containing compound such as an aminosilane or a phosphorus-containing compound. Methods for employing such compositions include applying the composition to a semiconductor substrate to remove at least a portion of a layer. |
申请公布号 |
US2015376462(A1) |
申请公布日期 |
2015.12.31 |
申请号 |
US201514750204 |
申请日期 |
2015.06.25 |
申请人 |
Cabot Microelectronics Corporation |
发明人 |
Fu Lin;Grumbine Steven;Dysard Jeffrey;Li Tina |
分类号 |
C09G1/02;H01L21/3105 |
主分类号 |
C09G1/02 |
代理机构 |
|
代理人 |
|
主权项 |
1. A chemical-mechanical polishing composition comprising:
a water based liquid carrier; colloidal silica abrasive particles dispersed in the liquid carrier; an aminosilane compound or a phosphonium silane compound incorporated in the colloidal silica abrasive particles internal to an outer surface thereof; an iron containing accelerator; and a pH in a range from about 1.5 to about 7. |
地址 |
Aurora IL US |