发明名称 TUNGSTEN CHEMICAL-MECHANICAL POLISHING COMPOSITION
摘要 A chemical-mechanical polishing composition includes colloidal silica abrasive particles having a chemical compound incorporated therein. The chemical compound may include a nitrogen-containing compound such as an aminosilane or a phosphorus-containing compound. Methods for employing such compositions include applying the composition to a semiconductor substrate to remove at least a portion of a layer.
申请公布号 US2015376462(A1) 申请公布日期 2015.12.31
申请号 US201514750204 申请日期 2015.06.25
申请人 Cabot Microelectronics Corporation 发明人 Fu Lin;Grumbine Steven;Dysard Jeffrey;Li Tina
分类号 C09G1/02;H01L21/3105 主分类号 C09G1/02
代理机构 代理人
主权项 1. A chemical-mechanical polishing composition comprising: a water based liquid carrier; colloidal silica abrasive particles dispersed in the liquid carrier; an aminosilane compound or a phosphonium silane compound incorporated in the colloidal silica abrasive particles internal to an outer surface thereof; an iron containing accelerator; and a pH in a range from about 1.5 to about 7.
地址 Aurora IL US