发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE HAVING CROSS-POINT ARRAY
摘要 According to an embodiment of the present invention, a substrate having a first conduction membrane formed on a base insulation membrane is prepared. A resistance change device structure is formed on the first conduction membrane. By using a first mask pattern layer extending in a first direction and having ends connected to each other, the resistance change device structure and the first conduction membrane are patterned, so a first intermediate pattern structure is formed. A second conduction membrane is laminated on the first intermediate pattern structure. By using a second mask pattern layer extending in a second direction crossing the first direction and having ends connected to each other, the second conduction membrane and the first intermediate pattern structure are patterned, so a second intermediate pattern structure is formed. A gap-fill insulation layer for filling at least the second intermediate pattern structure is formed. By using the cut mask pattern layer formed on the gap-fill insulation layer, connected ends of the second intermediate pattern structure are separated.
申请公布号 KR20150145631(A) 申请公布日期 2015.12.30
申请号 KR20140075980 申请日期 2014.06.20
申请人 SK HYNIX INC. 发明人 LEE, HYUN JIN
分类号 H01L21/8247;H01L21/027;H01L21/31;H01L27/115 主分类号 H01L21/8247
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