发明名称 IMAGING SPECTROMETER WITH EXTENDED RESOLUTION
摘要 <p>Interferometric transform spectrometer (ITS) systems and methods of operation thereof. In one example, an ITS system includes a Michelson interferometer that introduces a varying optical path length difference (OPD) between its two arms so as to produce an interferogram, a detector that receives and samples the interferogram, and a scan controller coupled to the detector and to Michelson interferometer. The scan controller controls the Michelson interferometer to vary the OPD in discrete steps such that the detector provides M samples of the interferogram for each of two scan segments. In the first scan segment, the M samples have a uniform or non-uniform sample spacing and the OPD has a first maximum value. In the second scan segment, the M samples have an incrementally increasing sample spacing and the OPD has a second maximum value that is at least twice the first maximum value.</p>
申请公布号 WO2015199793(A1) 申请公布日期 2015.12.30
申请号 WO2015US26116 申请日期 2015.04.16
申请人 RAYTHEON COMPANY 发明人 ROBINSON, IAN, S.;BLOOMER, JOHN, D.;FLANDERS, BRADLEY
分类号 G01J3/45;G01J3/453 主分类号 G01J3/45
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