发明名称 ETCH VARIATION TOLERANT OPTIMIZATION
摘要 <p>Disclosed herein is a computer-implemented method to improve a lithographic process for imaging a portion of a design layout onto a substrate using a lithographic projection apparatus and for transferring the imaged portion of the design layout to the substrate by an etching process, which includes the following steps: determining a value of at least one evaluation point of the lithographic process for each of a plurality of variations of the etching process; computing a multi-variable cost function of a plurality of design variables that are characteristics of the lithographic process, wherein the multi-variable cost function is a function of deviation from the determined values of the at least one evaluation point; and reconfiguring the characteristics of the lithographic process by adjusting the design variables until a termination condition is satisfied. This method may reduce the need of repeated adjustment to the lithographic process when the etching process varies.</p>
申请公布号 WO2015197313(A1) 申请公布日期 2015.12.30
申请号 WO2015EP62135 申请日期 2015.06.01
申请人 ASML NETHERLANDS B.V. 发明人 LIU, XIAOFENG
分类号 G03F7/20 主分类号 G03F7/20
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