发明名称 WAVELIKE HARD NANOMASK ON A TOPOGRAPHIC FEATURE AND METHODS OF MAKING AND USING
摘要 An array of nanowires with a period smaller than 150 nm can be used for optoelectronics and semiconductor electronics applications. A hard nanomask is registered to a lithographically defined feature and can be used to manufacture such structures. This nanomask includes a substantially periodic array of substantially parallel elongated elements having a wavelike cross-section. The fabrication method of the nanomask may be contactless and uses ion beams.
申请公布号 WO2015199573(A1) 申请公布日期 2015.12.30
申请号 WO2014RU00458 申请日期 2014.06.26
申请人 WOSTEC, INC. 发明人 SMIRNOV, VALERY KONSTANTINOVICH;KIBALOV, DMITRY STANISLAVOVICH
分类号 H01L21/265;B82Y40/00;H01L21/027 主分类号 H01L21/265
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