发明名称 |
WAVELIKE HARD NANOMASK ON A TOPOGRAPHIC FEATURE AND METHODS OF MAKING AND USING |
摘要 |
An array of nanowires with a period smaller than 150 nm can be used for optoelectronics and semiconductor electronics applications. A hard nanomask is registered to a lithographically defined feature and can be used to manufacture such structures. This nanomask includes a substantially periodic array of substantially parallel elongated elements having a wavelike cross-section. The fabrication method of the nanomask may be contactless and uses ion beams. |
申请公布号 |
WO2015199573(A1) |
申请公布日期 |
2015.12.30 |
申请号 |
WO2014RU00458 |
申请日期 |
2014.06.26 |
申请人 |
WOSTEC, INC. |
发明人 |
SMIRNOV, VALERY KONSTANTINOVICH;KIBALOV, DMITRY STANISLAVOVICH |
分类号 |
H01L21/265;B82Y40/00;H01L21/027 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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