发明名称 Method of manufacturing an oxide semiconductor device and method of manufacturing a display device having the same
摘要 Disclosed is a method of manufacturing an oxide semiconductor device, including: forming a gate electrode on a substrate; forming a gate insulating layer on the gate electrode; forming an active pattern on the gate insulating layer; forming a first mask pattern on the gate insulating layer and the active pattern; forming an insulating interlayer on the gate insulating layer, the active pattern, and the first mask pattern; forming a second mask pattern on the insulating interlayer, the second mask pattern comprising an opening that exposes a region where the first mask pattern is formed; forming contact holes exposing portions of the active pattern by patterning the insulating interlayer using the first mask pattern and the second mask pattern; and forming a source electrode and a drain electrode on the gate insulating layer by filling the contact holes, the drain electrode spaced apart from the source electrode.
申请公布号 US9224831(B2) 申请公布日期 2015.12.29
申请号 US201314140944 申请日期 2013.12.26
申请人 Samsung Display Co., Ltd. 发明人 Lee Bong-Won
分类号 H01L21/336;H01L21/84;H01L29/66;H01L29/786;H01L27/12 主分类号 H01L21/336
代理机构 H.C. Park & Associates, PLC 代理人 H.C. Park & Associates, PLC
主权项 1. A method of manufacturing an oxide semiconductor device, the method comprising: forming a gate electrode on a substrate; forming a gate insulating layer on the gate electrode; forming an active pattern on the gate insulating layer; forming a first mask pattern on the gate insulating layer and the active pattern; forming an insulating interlayer on the gate insulating layer, the active pattern, and the first mask pattern; forming a second mask pattern on the insulating interlayer, the second mask pattern comprising an opening that exposes a region where the first mask pattern is formed; forming contact holes exposing portions of the active pattern by patterning the insulating interlayer using the first mask pattern and the second mask pattern; removing the first mask pattern and the second mask pattern after patterning the insulating interlayer using the first mask pattern and the second mask pattern; and forming a source electrode and a drain electrode on the active pattern by filling the contact holes, the drain electrode spaced apart from the source electrode.
地址 Yongin-si KR