| 摘要 |
A semiconductor device may include: multiple data pads; multiple data buffers which buffer and output signals inputted into a first input terminal by using a voltage inputted through a second input terminal; and a calibration control unit which generates test signals in a calibration mode, receives the output of data buffers while controlling the level of test signals and controls the offset of data buffers for the logical value of the output of data buffers to be transited when the test signals are at a target level. The semiconductor device inputs data of a data pad corresponding to the first input terminal and applies a reference voltage to the second input terminal, while in the calibration mode, the semiconductor device can input the test signals to the first input unit and apply a test voltage to the second input terminal. |
