发明名称 Sulfonamide-containing topcoat and photoresist additive compositions and methods of use
摘要 Provided are sulfonamide-containing compositions, topcoat polymers, and additive polymers for use in lithographic processes that have improved static receding water contact angles over those known in the art. The sulfonamide-containing topcoat polymers and additive polymers of the present invention include sulfonamide-substituted repeat units with branched linking group as shown in Formula (I):;
申请公布号 US9223217(B2) 申请公布日期 2015.12.29
申请号 US201012709277 申请日期 2010.02.19
申请人 International Business Machines Corporation;Central Glass Co., Ltd. 发明人 Sanders Daniel Paul;Fujiwara Masaki;Terui Yoshiharu
分类号 G03F7/004;G03F7/11;G03F7/20;G03F7/038;G03F7/039 主分类号 G03F7/004
代理机构 CanaanLaw, P.C. 代理人 Canaan Karen;CanaanLaw, P.C.
主权项 1. A composition, comprising a polymer comprising a repeat unit comprising a sulfonamide group and a branched linking group according to Formula (I)wherein: R1 and R2 are independently selected from the group consisting of hydrogen, fluorine, methyl, and trifluoromethyl; R3 is selected from the group consisting of hydrogen, a halogen, C1-C12 alkyl, and fluorinated C1-C12 alkyl; R4, R5, and R6 are independently selected from hydrogen, fluorine, and fluorinated C1-C12 alkyl; R7 is fluorinated C1-C12 alkyl; and at least one of R4, R5, and R6 includes carbon.
地址 Armonk NY US