发明名称 |
Sulfonamide-containing topcoat and photoresist additive compositions and methods of use |
摘要 |
Provided are sulfonamide-containing compositions, topcoat polymers, and additive polymers for use in lithographic processes that have improved static receding water contact angles over those known in the art. The sulfonamide-containing topcoat polymers and additive polymers of the present invention include sulfonamide-substituted repeat units with branched linking group as shown in Formula (I):; |
申请公布号 |
US9223217(B2) |
申请公布日期 |
2015.12.29 |
申请号 |
US201012709277 |
申请日期 |
2010.02.19 |
申请人 |
International Business Machines Corporation;Central Glass Co., Ltd. |
发明人 |
Sanders Daniel Paul;Fujiwara Masaki;Terui Yoshiharu |
分类号 |
G03F7/004;G03F7/11;G03F7/20;G03F7/038;G03F7/039 |
主分类号 |
G03F7/004 |
代理机构 |
CanaanLaw, P.C. |
代理人 |
Canaan Karen;CanaanLaw, P.C. |
主权项 |
1. A composition, comprising a polymer comprising a repeat unit comprising a sulfonamide group and a branched linking group according to Formula (I)wherein:
R1 and R2 are independently selected from the group consisting of hydrogen, fluorine, methyl, and trifluoromethyl; R3 is selected from the group consisting of hydrogen, a halogen, C1-C12 alkyl, and fluorinated C1-C12 alkyl; R4, R5, and R6 are independently selected from hydrogen, fluorine, and fluorinated C1-C12 alkyl; R7 is fluorinated C1-C12 alkyl; and at least one of R4, R5, and R6 includes carbon. |
地址 |
Armonk NY US |