发明名称 |
Image forming apparatus, method for forming test pattern, and computer program product |
摘要 |
An image forming apparatus includes a recording head in which a plurality of nozzles for discharging liquid droplets; and a pattern forming unit configured to form a test pattern used for positional deviation adjustment including a first pattern serving as a reference pattern and a second pattern serving as an adjustment pattern. The first pattern and the second pattern each are a linear pattern that is parallel to a nozzle arrangement direction and has a disconnected portion. The disconnected portion of the first pattern and the disconnected portion of the second pattern are shifted from each other in the nozzle arrangement direction. |
申请公布号 |
US9221284(B2) |
申请公布日期 |
2015.12.29 |
申请号 |
US201314094576 |
申请日期 |
2013.12.02 |
申请人 |
Ricoh Company, Ltd. |
发明人 |
Okada Tatsuhiko;Yorimoto Mamoru;Horikawa Daisaku;Sakurada Yuichi;Moriwaki Makoto |
分类号 |
B41J29/393;B41J29/38;B41J2/12 |
主分类号 |
B41J29/393 |
代理机构 |
Duft Bornsen & Fettig LLP |
代理人 |
Duft Bornsen & Fettig LLP |
主权项 |
1. An image forming apparatus comprising:
a recording head in which a plurality of nozzles for discharging liquid droplets is arranged in a sub-scanning direction; and a pattern forming unit configured to form a test pattern used for positional deviation adjustment including a first pattern serving as a reference pattern and a second pattern serving as an adjustment pattern; wherein the first pattern and the second pattern each extend for lengths in a direction parallel to the sub-scanning direction and separated by a distance in a main-scanning direction; wherein the first pattern and the second pattern each include a not-printed portion with printed portions formed on both sides of the not-printed portion in the sub-scanning direction; wherein the not-printed portions of the first and the second pattern are shifted from each other in the sub-scanning direction; and wherein the printed portions of the first and the second pattern overlap in the main-scanning direction for a majority of their respective lengths in the sub-scanning direction. |
地址 |
Tokyo JP |