发明名称 Image forming apparatus, method for forming test pattern, and computer program product
摘要 An image forming apparatus includes a recording head in which a plurality of nozzles for discharging liquid droplets; and a pattern forming unit configured to form a test pattern used for positional deviation adjustment including a first pattern serving as a reference pattern and a second pattern serving as an adjustment pattern. The first pattern and the second pattern each are a linear pattern that is parallel to a nozzle arrangement direction and has a disconnected portion. The disconnected portion of the first pattern and the disconnected portion of the second pattern are shifted from each other in the nozzle arrangement direction.
申请公布号 US9221284(B2) 申请公布日期 2015.12.29
申请号 US201314094576 申请日期 2013.12.02
申请人 Ricoh Company, Ltd. 发明人 Okada Tatsuhiko;Yorimoto Mamoru;Horikawa Daisaku;Sakurada Yuichi;Moriwaki Makoto
分类号 B41J29/393;B41J29/38;B41J2/12 主分类号 B41J29/393
代理机构 Duft Bornsen & Fettig LLP 代理人 Duft Bornsen & Fettig LLP
主权项 1. An image forming apparatus comprising: a recording head in which a plurality of nozzles for discharging liquid droplets is arranged in a sub-scanning direction; and a pattern forming unit configured to form a test pattern used for positional deviation adjustment including a first pattern serving as a reference pattern and a second pattern serving as an adjustment pattern; wherein the first pattern and the second pattern each extend for lengths in a direction parallel to the sub-scanning direction and separated by a distance in a main-scanning direction; wherein the first pattern and the second pattern each include a not-printed portion with printed portions formed on both sides of the not-printed portion in the sub-scanning direction; wherein the not-printed portions of the first and the second pattern are shifted from each other in the sub-scanning direction; and wherein the printed portions of the first and the second pattern overlap in the main-scanning direction for a majority of their respective lengths in the sub-scanning direction.
地址 Tokyo JP