发明名称 Semiconductor device and method for manufacturing same
摘要 This semiconductor device (101) includes: a substrate (1); a thin-film transistor (10) which includes an oxide semiconductor layer (6) as its active layer; a protective layer (11) covering the thin-film transistor; a metal layer (9d, 9t) interposed between the protective layer (11) and the substrate (1); a transparent conductive layer (13, 13t) formed on the protective layer (11); and a connecting portion (20, 30) to electrically connect the metal layer (9d, 9t) and the transparent conductive layer (13, 13t) together. The connecting portion (20, 30) includes an oxide connecting layer (6a, 6t) which is formed out of a same oxide film as a oxide semiconductor layer (6) and which has a lower electrical resistance than the oxide semiconductor layer (6). The metal layer (9d, 9t) is electrically connected to the transparent conductive layer (13, 13t) via the oxide connecting layer (6a, 6t).
申请公布号 US9224869(B2) 申请公布日期 2015.12.29
申请号 US201314427401 申请日期 2013.09.09
申请人 Sharp Kabushiki Kaisha 发明人 Shimada Yukimine;Nishiki Hirohiko;Kitoh Kenichi
分类号 H01L29/786;H01L27/12;H01L21/02;H01L21/441;H01L29/24;H01L29/417;H01L29/66;G02F1/1368;H01L23/532 主分类号 H01L29/786
代理机构 Keating & Bennett, LLP 代理人 Keating & Bennett, LLP
主权项 1. A semiconductor device comprising: a substrate; a thin-film transistor which is supported on the substrate and which includes an oxide semiconductor layer as its active layer; a protective layer covering the thin-film transistor; a metal layer interposed between the protective layer and the substrate; a transparent conductive layer formed on the protective layer; and a connecting portion to electrically connect the metal layer and the transparent conductive layer together, wherein the connecting portion includes an oxide connecting layer which is formed out of a same oxide film as the oxide semiconductor layer and which has a lower electrical resistance than the oxide semiconductor layer, and the metal layer is electrically connected to the transparent conductive layer via the oxide connecting layer.
地址 Osaka JP