发明名称 CMOS nanowire structure
摘要 Complimentary metal-oxide-semiconductor nanowire structures are described. For example, a semiconductor structure includes a first semiconductor device. The first semiconductor device includes a first nanowire disposed above a substrate. The first nanowire has a mid-point a first distance above the substrate and includes a discrete channel region and source and drain regions on either side of the discrete channel region. A first gate electrode stack completely surrounds the discrete channel region of the first nanowire. The semiconductor structure also includes a second semiconductor device. The second semiconductor device includes a second nanowire disposed above the substrate. The second nanowire has a mid-point a second distance above the substrate and includes a discrete channel region and source and drain regions on either side of the discrete channel region. The first distance is different from the second distance. A second gate electrode stack completely surrounds the discrete channel region of the second nanowire.
申请公布号 US9224810(B2) 申请公布日期 2015.12.29
申请号 US201113996503 申请日期 2011.12.23
申请人 Intel Corporation 发明人 Kim Seiyon;Kuhn Kelin J.;Ghani Tahir;Murthy Anand S.;Cappellani Annalisa;Cea Stephen M.;Rios Rafael;Glass Glenn A.
分类号 H01L29/06;H01L21/8238;H01L27/092;H01L27/12;B82Y10/00;H01L29/66;H01L29/775 主分类号 H01L29/06
代理机构 Blakely, Sokoloff, Taylor & Zafman LLP 代理人 Blakely, Sokoloff, Taylor & Zafman LLP
主权项 1. A semiconductor structure, comprising: a first semiconductor device comprising: a first plurality of vertically stacked nanowires disposed above a substrate, the bottom most nanowire of the first plurality of vertically stacked nanowires having a mid-point a first distance above the substrate, and each of the nanowires of the first plurality of vertically stacked nanowires comprising a discrete channel region and discrete source and drain regions on either side of the discrete channel region;a first gate electrode stack completely surrounding the discrete channel region of each of the nanowires of the first plurality of vertically stacked nanowires; anda first pair of contacts completely surrounding the discrete source and drain regions of each of the nanowires of the first plurality of vertically stacked nanowires; and a second semiconductor device comprising: a second plurality of vertically stacked nanowires disposed above the substrate, the bottom most nanowire of the second plurality of vertically stacked nanowires having a mid-point a second distance above the substrate, and each of the nanowires of the second plurality of vertically stacked nanowires comprising a discrete channel region and discrete source and drain regions on either side of the discrete channel region, the first distance different from the second distance;a second gate electrode stack completely surrounding the discrete channel region of each of the nanowires of the second plurality of vertically stacked nanowires; anda second pair of contacts completely surrounding the discrete source and drain regions of each of the nanowires of the second plurality of vertically stacked nanowires.
地址 Santa Clara CA US