发明名称 Nonvolatile memory device using variable resistive element and memory system having the same
摘要 A nonvolatile memory device, which has an improved read reliability through a refresh operation, and a memory system, are provided. The nonvolatile memory device includes a resistive memory cell, a reference resistor corresponding to the resistive memory cell, a reference sense amplifier electrically connected to the reference resistor and configured to change a transition time of an output value of the reference resistor, and a refresh request signal generator configured to output the refresh request signal for the resistive memory cell when the transition time of an output value of the reference resistor is in a preset refresh requiring period.
申请公布号 US9224441(B2) 申请公布日期 2015.12.29
申请号 US201314099330 申请日期 2013.12.06
申请人 Samsung Electronics Co., Ltd. 发明人 Lee Sung-Yeon;Lee Yeong-Taek
分类号 G11C7/14;G11C11/16;G11C11/406;G11C11/56;G11C13/00;G11C16/28;G11C16/34 主分类号 G11C7/14
代理机构 Myers Bigel Sibley & Sajovec, PA 代理人 Myers Bigel Sibley & Sajovec, PA
主权项 1. A nonvolatile memory device comprising: a resistive memory cell; a reference resistor corresponding to the resistive memory cell; a reference sense amplifier electrically connected to the reference resistor and configured to generate a reference output signal based on the reference resistor; and a refresh request signal generator configured to output a refresh request signal for the resistive memory cell responsive to the reference output signal and a refresh period mask signal, the refresh period mask signal being indicative of a time period in which the resistive memory cell is in need of refresh.
地址 KR
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