发明名称 |
Nonvolatile memory device using variable resistive element and memory system having the same |
摘要 |
A nonvolatile memory device, which has an improved read reliability through a refresh operation, and a memory system, are provided. The nonvolatile memory device includes a resistive memory cell, a reference resistor corresponding to the resistive memory cell, a reference sense amplifier electrically connected to the reference resistor and configured to change a transition time of an output value of the reference resistor, and a refresh request signal generator configured to output the refresh request signal for the resistive memory cell when the transition time of an output value of the reference resistor is in a preset refresh requiring period. |
申请公布号 |
US9224441(B2) |
申请公布日期 |
2015.12.29 |
申请号 |
US201314099330 |
申请日期 |
2013.12.06 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Lee Sung-Yeon;Lee Yeong-Taek |
分类号 |
G11C7/14;G11C11/16;G11C11/406;G11C11/56;G11C13/00;G11C16/28;G11C16/34 |
主分类号 |
G11C7/14 |
代理机构 |
Myers Bigel Sibley & Sajovec, PA |
代理人 |
Myers Bigel Sibley & Sajovec, PA |
主权项 |
1. A nonvolatile memory device comprising:
a resistive memory cell; a reference resistor corresponding to the resistive memory cell; a reference sense amplifier electrically connected to the reference resistor and configured to generate a reference output signal based on the reference resistor; and a refresh request signal generator configured to output a refresh request signal for the resistive memory cell responsive to the reference output signal and a refresh period mask signal, the refresh period mask signal being indicative of a time period in which the resistive memory cell is in need of refresh. |
地址 |
KR |