发明名称 CHEMICALLY AMPLIFIED RESIST COMPOSITION AND PATTERN FORMING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a chemically amplified resist composition that can give a pattern having extremely high resolution and a small degree of LER.SOLUTION: The chemically amplified resist composition comprises: a sulfonium salt represented by formula (1); and a polymeric compound having a repeating unit represented by formula (U-1), which is decomposed by an action of an acid to increase solubility in an alkali developer.
申请公布号 JP2015232598(A) 申请公布日期 2015.12.24
申请号 JP20140118577 申请日期 2014.06.09
申请人 SHIN ETSU CHEM CO LTD 发明人 FUKUSHIMA MASAHIRO;DOMON DAISUKE;MASUNAGA KEIICHI;WATANABE SATOSHI
分类号 G03F7/004;C08F212/14;C08F220/30;G03F7/039 主分类号 G03F7/004
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