ALPHA RAY OBSERVATION APPARATUS, ALPHA RAY OBSERVATION SYSTEM AND ALPHA RAY OBSERVATION METHOD

摘要

An alpha ray observation apparatus, according to an embodiment, that observes alpha rays by detecting alpha ray caused light generated from an alpha ray source in a to-be-observed object, including: an alpha ray caused light wavelength selecting unit that can select light including wavelength of the alpha ray caused light; an alpha ray caused light detecting unit that measures an amount of alpha ray caused light; a short-side wavelength selecting unit that can select light of a short-side wavelength that is shorter than the wavelength of the alpha ray caused light; a short-side wavelength light detecting unit; a long-side wavelength selecting unit that can select light of a long-side wavelength that longer than the wavelength of the alpha ray caused light; a long-side wavelength light detecting unit; and a correction unit that calculates a corrected light amount by correcting the amount of the alpha ray caused light.

主权项

1. An alpha ray observation apparatus that observes alpha rays by detecting alpha-ray-caused light which is generated from interaction between an atmosphere substance and alpha rays generated from an alpha ray source in a to-be-observed object, the apparatus comprising:
an alpha-ray-caused light wavelength selecting unit that can select light of a predetermined wavelength width including wavelength of the alpha-ray-caused light; an alpha-ray-caused light detecting unit to measure an amount XA of alpha-ray-caused light coming from the alpha-ray-caused light wavelength selecting unit; a short-side wavelength selecting unit that can select light of a short-side wavelength that is close to the wavelength of the alpha-ray-caused light and is shorter than the wavelength of the alpha-ray-caused light; a short-side wavelength light detecting unit to measure an amount BS of short-side wavelength light coming from the short-side wavelength selecting unit; a long-side wavelength selecting unit that can select light of a long-side wavelength that is close to the wavelength of the alpha-ray-caused light and is longer than the wavelength of the alpha-ray-caused light; a long-side wavelength light detecting unit to measure an amount BL of long-side wavelength light coming from the long-side wavelength selecting unit; and a correction unit to calculate a corrected light amount XAT by correcting the amount XA of the alpha-ray-caused light based on the amount XA of the alpha-ray-caused light, the amount BS of the short-side wavelength light, and the amount BL of the long-side wavelength light.