发明名称 |
MATHEMATICAL IMAGE ASSEMBLY IN A SCANNING-TYPE MICROSCOPE |
摘要 |
A method of accumulating an image of a specimen using a scanning-type microscope, comprising the following steps:
Providing a beam of radiation that is directed from a source through an illuminator so as to irradiate the specimen;Providing a detector for detecting a flux of radiation emanating from the specimen in response to said irradiation;Causing said beam to undergo scanning motion relative to a surface of the specimen, and recording an output of the detector as a function of scan position, which method additionally comprises the following steps:In a first sampling session S1gathering detector data from a first collection P1 of sampling points distributed sparsely across the specimen;Repeating this procedure so as to accumulate a set {Pn} of such collections, gathered during an associated set {Sn} of sampling sessions, each set with a cardinality N>1;Assembling an image of the specimen by using the set {Pn} as input to an integrative mathematical reconstruction procedure,
wherein, as part of said assembly process, a mathematical registration correction is made to compensate for drift mismatches between different members of the set {Pn}. |
申请公布号 |
US2015371815(A1) |
申请公布日期 |
2015.12.24 |
申请号 |
US201514743780 |
申请日期 |
2015.06.18 |
申请人 |
FEI Company |
发明人 |
Potocek Pavel;Kooijman Cornelis Sander;Slingerland Hendrik Nicolaas;van Veen Gerard Anne Nikolaas;Boughorbel Faysal |
分类号 |
H01J37/22;G02B21/00;H01J37/28 |
主分类号 |
H01J37/22 |
代理机构 |
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代理人 |
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主权项 |
1. A method of accumulating an image of a specimen using a scanning-type microscope, comprising the following steps:
providing a beam of radiation that is directed from a source through an illuminator so as to irradiate the specimen; providing a detector for detecting a flux of radiation emanating from the specimen in response to said irradiation; causing said beam to undergo scanning motion relative to a surface of the specimen, and recording an output of the detector as a function of scan position,
in a first sampling session S1, gathering detector data from a first collection P1 of sampling points distributed sparsely across the specimen;repeating this the procedure of gathering detector data from subsequent collections of sampling points so as to accumulate a set {Pn} of such collections, gathered during an associated set {Sn} of sampling sessions, each set with a cardinality N>1;assembling an image of the specimen by using the set {Pn} as input to an integrative mathematical reconstruction procedure,wherein, as part of said assembly process, a mathematical registration correction is made to compensate for drift mismatches between different members of the set {Pn}. |
地址 |
Hillsboro OR US |