SYSTEM AND METHOD FOR TESTING ADDRESS-SWAP FAULTS IN MULTIPORT MEMORIES

摘要

A system method of detecting address-swap faults in a multiport memory as described herein includes minimum testing for inversion faults and bit-swap faults for each port of the multiport memory. Different test types may be performed for inversion and bit-swap including pass/fail, and diagnostic testing for locating faulty ports. Pass/fail testing may be used for identifying whether the IC is good or bad, and additional diagnostic testing using additional cycles may be used for disabling faulty ports or correcting inverted address bits. The test method may be implemented as a function test or as a memory built-in self-test. The test method may be used during manufacturing test or during function design verification.

主权项

1. A method of detecting address-swap faults in a multiport memory, comprising:
initializing each addressable location with a first data value via a first port of the multiport memory; writing a second data value to a first address via the first port, wherein the second data value is different from the first data value; and for every port of the multiport memory other than the first port:
reading a stored data value at the first address via the port, andfailing the port when the stored data value is not equal to the second data value.