发明名称 半導体装置およびその製造方法
摘要 <p>A semiconductor device according to the present embodiment includes a semiconductor substrate. A lower-layer wiring is provided above a surface of the semiconductor substrate. An interlayer dielectric film is provided on the lower-layer wiring and includes a four-layer stacked structure. A contact plug contains aluminum. The contact plug is filled in a contact hole formed in the interlayer dielectric film in such a manner that the contact plug reaches the lower-layer wiring. Two upper layers and two lower layers in the stacked structure respectively have tapers on an inner surface of the contact hole. The taper of two upper layers and the taper of two lower layers have different angles from each other.</p>
申请公布号 JP5835696(B2) 申请公布日期 2015.12.24
申请号 JP20120195167 申请日期 2012.09.05
申请人 株式会社東芝 发明人 稲 葉 芽 里;飛 沢 健
分类号 H01L21/768;H01L21/336;H01L21/8247;H01L23/522;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/768
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