发明名称 TRANSISTOR AND SEMICONDUCTOR DEVICE
摘要 A transistor with small parasitic capacitance is provided. The transistor includes an oxide semiconductor, a first conductor, a second conductor, a third conductor, a first insulator, and a second insulator. The first conductor includes a first region, a second region, and a third region. The oxide semiconductor includes a fourth region, a fifth region, and a sixth region. The first region has a region where the first region and the sixth region overlap each other with the first insulator positioned therebetween. The second region has a region where the second region and the second conductor overlap each other with the first insulator and the second insulator positioned therebetween. The third region has a region where the third region and the third conductor overlap each other with the first insulator and the second insulator positioned therebetween. The fourth region has a region in contact with the second conductor.
申请公布号 US2015372009(A1) 申请公布日期 2015.12.24
申请号 US201514739273 申请日期 2015.06.15
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 YAMAZAKI Shunpei
分类号 H01L27/12;H01L29/04;H01L27/092;H01L29/16;H01L29/786;H01L29/24 主分类号 H01L27/12
代理机构 代理人
主权项 1. A transistor comprising: an oxide semiconductor; a first conductor; a second conductor; a third conductor; a first insulator; and a second insulator, wherein the first conductor includes a first region, a second region, and a third region, wherein the oxide semiconductor includes a fourth region, a fifth region, and a sixth region, wherein the first region and the sixth region overlap each other with the first insulator positioned between the first region and the sixth region, wherein the second region and the second conductor overlap each other with the first insulator and the second insulator positioned between the second region and the second conductor, wherein the third region and the third conductor overlap each other with the first insulator and the second insulator positioned between the third region and the third conductor, wherein the second conductor is in contact with the fourth region, wherein the third conductor is in contact with the fifth region, and wherein the sixth region includes a lower carrier density than the fourth region and the fifth region.
地址 Atsugi-shi JP