发明名称 SEMICONDUCTOR DEVICE WITH AIR GAP AND METHOD FOR FABRICATING THE SAME
摘要 A method for fabricating a semiconductor device includes forming an insulation layer over a substrate; forming an open portion in the insulation layer; forming a sacrificial spacer over sidewalls of the open portion; forming, over the sacrificial spacer, a first conductive pattern in a lower section of the open portion; forming an ohmic contact layer over the first conductive pattern; forming an air gap by removing the sacrificial spacer; capping the air gap by forming a barrier layer over the ohmic contact layer; and forming a second conductive pattern over the barrier layer to fill an upper section of the open portion.
申请公布号 US2015371891(A1) 申请公布日期 2015.12.24
申请号 US201514841259 申请日期 2015.08.31
申请人 SK hynix Inc. 发明人 LEE Hyo-Seok;YEOM Seung-Jin;LIM Sung-Won;HONG Seung-Hee;LEE Nam-Yeal
分类号 H01L21/768;H01L49/02;H01L21/28 主分类号 H01L21/768
代理机构 代理人
主权项
地址 Gyeonggi-do KR