| 发明名称 |
ANISOTROPIC MULTIPHYSICS SENSING SYSTEMS FOR MATERIALS AND METHODS OF USING THE SAME |
| 摘要 |
The present invention is directed to a method to measure a non-electrical property of an object using an electrical property measurement, and applications for the method. The invention is also directed to a transducer, and uses for the transducers. |
| 申请公布号 |
US2015369767(A1) |
申请公布日期 |
2015.12.24 |
| 申请号 |
US201514747695 |
申请日期 |
2015.06.23 |
| 申请人 |
Steuben John C.;Turner Cameron J.;Van Bossuyt Douglas Lee |
发明人 |
Steuben John C.;Turner Cameron J.;Van Bossuyt Douglas Lee |
| 分类号 |
G01N27/04;G01N27/22 |
主分类号 |
G01N27/04 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method for detecting at least one physical property of a layered material, comprising:
providing an electrical current to the layered material; measuring a resistance in the layered material; and determining at the least one physical property of the layered material based at least partially on the resistance. |
| 地址 |
Lakewood CO US |
