发明名称 3次元測定機検証用長尺ゲージ
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a highly accurate long gauge for a three-dimensional measuring instrument which has a simple structure, can be easily manufactured, and can be also used for verification of a measurement error due to a direction of a probe tip. <P>SOLUTION: The long gauge for a three-dimensional measuring instrument comprises: a long gauge body 1A which has a rectangular cross section shape and where multiple reference holes 1B, each of which is a reference measurement surface against which a probe of the three-dimensional measuring instrument abuts, are arranged along a longitudinal direction penetrating between an upper surface and a lower surface; and multiple supporting legs 1a protrusively provided on the lower surface of the gauge body and one of side surfaces perpendicular to the lower surface. The supporting legs are protrusively provided at positions near both ends in a longitudinal direction and a middle position on each of the lower surface and the one side surface, so as to be vertices of a flat isosceles triangle. The gauge body is supported toward a measurement table surface of the three-dimensional measuring instrument by the supporting legs on one of the lower surface and the one side surface. <P>COPYRIGHT: (C)2012,JPO&INPIT</p>
申请公布号 JP5837360(B2) 申请公布日期 2015.12.24
申请号 JP20110181945 申请日期 2011.08.23
申请人 株式会社浅沼技研 发明人 浅沼 進
分类号 G01B3/30;G01B5/00 主分类号 G01B3/30
代理机构 代理人
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