发明名称 半導体装置の製造方法
摘要 <p>A method of manufacturing a semiconductor device includes: forming a conductive film on a semiconductor substrate; patterning the conductive film in a memory region to form a first gate electrode; after forming the first gate electrode, forming a mask film above each of the conductive film in a logic region and the first gate electrode; removing the mask film in the logic region; forming a first resist film above the mask film left in the memory region and above the conductive film left in the logic region; and forming a second gate electrode in the logic region by etching the conductive film using the first resist film as a mask.</p>
申请公布号 JP5834909(B2) 申请公布日期 2015.12.24
申请号 JP20110289254 申请日期 2011.12.28
申请人 富士通セミコンダクター株式会社 发明人 鳥井 智史
分类号 H01L21/8247;H01L21/28;H01L21/3213;H01L21/336;H01L21/768;H01L21/8234;H01L27/088;H01L27/10;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
代理机构 代理人
主权项
地址
您可能感兴趣的专利