发明名称 |
SOLID-STATE IMAGING DEVICE, MANUFACTURING METHOD OF SOLID-STATE IMAGING DEVICE, MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, AND ELECTRONIC DEVICE |
摘要 |
A solid-state imaging device has a sensor substrate having a pixel region on which photoelectric converters are arrayed; a driving circuit provided on a front face side that is opposite from a light receiving face as to the photoelectric converters on the sensor substrate; an insulation layer, provided on the light receiving face, and having a stepped construction wherein the film thickness of the pixel region is thinner than the film thickness in a periphery region provided on the outside of the pixel region; a wiring provided to the periphery region on the light receiving face side; and on-chip lenses provided to positions corresponding to the photoelectric converters on the insulation layer. |
申请公布号 |
US2015372041(A1) |
申请公布日期 |
2015.12.24 |
申请号 |
US201514841958 |
申请日期 |
2015.09.01 |
申请人 |
Sony Corporation |
发明人 |
Mitsuhashi Ikue;Akiyama Kentaro;Kikuchi Koji |
分类号 |
H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
1. A solid-state imaging device comprising:
a sensor substrate having a pixel region on which photoelectric converters are arrayed; a driving circuit provided on a front face side that is opposite from a light receiving face as to said photoelectric converters on said sensor substrate; an insulation layer, provided on said light receiving face, and having a stepped construction wherein the film thickness of said pixel region is thinner than the film thickness in a periphery region provided on the outside of the pixel region; a wiring provided to said periphery region on said light receiving face side; and on-chip lenses provided to positions corresponding to said photoelectric converters on said insulation layer. |
地址 |
Tokyo JP |