| 发明名称 |
DYNAMIC LIGHT SCATTERING MEASUREMENT DEVICE AND DYNAMIC LIGHT SCATTERING MEASUREMENT METHOD |
| 摘要 |
A dynamic light scattering measurement device includes an irradiation section that applies light emitted from a low-coherence light source to a sample that includes particles, a spectral intensity acquisition section that disperses reflected light from a reference plane and scattered light from the sample that has passed through the reference plane to acquire a spectral intensity of interference light of the reflected light and the scattered light, the reference plane being situated to intersect an optical path through which the light is applied to the sample, and a measurement section that measures dynamic light scattering of the sample based on the acquired spectral intensity. |
| 申请公布号 |
US2015369733(A1) |
申请公布日期 |
2015.12.24 |
| 申请号 |
US201514743167 |
申请日期 |
2015.06.18 |
| 申请人 |
Otsuka Electronics Co., Ltd. ;National University Corporation Tokyo University of Agriculture and Technology |
发明人 |
IZUTANI Yusuke;IWAI Toshiaki |
| 分类号 |
G01N21/51;G01N21/03 |
主分类号 |
G01N21/51 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A dynamic light scattering measurement device comprising:
an irradiation section that applies light emitted from a low-coherence light source to a sample that includes particles; a spectral intensity acquisition section that disperses reflected light from a reference plane and scattered light from the sample that has passed through the reference plane to acquire a spectral intensity of interference light of the reflected light and the scattered light, the reference plane being situated to intersect an optical path through which the light is applied to the sample; and a measurement section that measures dynamic light scattering of the sample based on the acquired spectral intensity. |
| 地址 |
Osaka JP |
