发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To reduce the parasitic capacitance of a transistor having a gate all around (GAA) structure.SOLUTION: A channel region 11 made of a silicon film is formed on a silicon oxide film 3 arranged on a silicon substrate 2. Phosphorus is injected into the silicon oxide film 3 under the channel region 11 and on a side thereof so as to form a modified part having a higher etching rate than that of a region into which phosphorus is not injected. Phosphorus is injected into the silicon oxide film 3 under the channel region 11 also through the channel region 11. Then, a cavity is formed by removing the modified part 21 by isotropic wet etching. A gate electrode is deposited inside and above the cavity. |
申请公布号 |
JP2015233073(A) |
申请公布日期 |
2015.12.24 |
申请号 |
JP20140119288 |
申请日期 |
2014.06.10 |
申请人 |
FUJITSU SEMICONDUCTOR LTD |
发明人 |
PIDIN SERGEI |
分类号 |
H01L29/786;H01L21/265;H01L29/41;H01L29/423;H01L29/49 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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