发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce the parasitic capacitance of a transistor having a gate all around (GAA) structure.SOLUTION: A channel region 11 made of a silicon film is formed on a silicon oxide film 3 arranged on a silicon substrate 2. Phosphorus is injected into the silicon oxide film 3 under the channel region 11 and on a side thereof so as to form a modified part having a higher etching rate than that of a region into which phosphorus is not injected. Phosphorus is injected into the silicon oxide film 3 under the channel region 11 also through the channel region 11. Then, a cavity is formed by removing the modified part 21 by isotropic wet etching. A gate electrode is deposited inside and above the cavity.
申请公布号 JP2015233073(A) 申请公布日期 2015.12.24
申请号 JP20140119288 申请日期 2014.06.10
申请人 FUJITSU SEMICONDUCTOR LTD 发明人 PIDIN SERGEI
分类号 H01L29/786;H01L21/265;H01L29/41;H01L29/423;H01L29/49 主分类号 H01L29/786
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