发明名称 METHOD AND APPARATUS FOR HEALING PHASE CHANGE MEMORY DEVICES
摘要 A first memory cell including a phase change material. The first memory cell is programmable to store one data value of a plurality of data values. The plurality of data values are represented by a plurality of non-overlapping ranges of resistance of the first memory cell. At least one testing pulse is applied to the first memory cell to establish a cell resistance of the first memory cell in an intermediate range of resistance, the intermediate range of resistance in between first and second adjacent ranges in the plurality of non-overlapping ranges of resistance representing the plurality of data values. After applying the at least one testing pulse to the first memory cell, it is determined whether to apply at least one healing pulse to repair the first memory cell, depending on relative values of (i) the cell resistance in the intermediate range of resistance and (ii) a reference resistance in the intermediate range of resistance.
申请公布号 US2015371704(A1) 申请公布日期 2015.12.24
申请号 US201414566453 申请日期 2014.12.10
申请人 Macronix International Co., Ltd. 发明人 Khwa Win San;Wu Chao-I;Su Tzu-Hsiang;Li Hsiang-Pang
分类号 G11C13/00 主分类号 G11C13/00
代理机构 代理人
主权项 1. A method of operating a first memory cell including a phase change material, the first memory cell programmable to store one data value of a plurality of data values, the plurality of data values represented by a plurality of non-overlapping ranges of resistance of the first memory cell, the method comprising: applying at least one testing pulse to the first memory cell to establish a cell resistance of the first memory cell in an intermediate range of resistance, the intermediate range of resistance including resistance values in between first and second adjacent ranges in the plurality of non-overlapping ranges of resistance representing the plurality of data values; and after applying the at least one testing pulse to the first memory cell, determining whether to apply at least one healing pulse to the first memory cell, depending on relative values of (i) the cell resistance in the intermediate range of resistance and (ii) a reference resistance in the intermediate range of resistance.
地址 Hsinchu TW