发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide: a semiconductor device which enables the suppression of the worsening of embedded layer's crystallinity, and the enhancement of the property of a breakdown voltage; and a method for manufacturing such a semiconductor device.SOLUTION: A semiconductor device comprises: a semiconductor substrate; a mesa provided on the semiconductor substrate and including an active layer; and an Fe-doped InP embedded layer formed on the semiconductor substrate so as to extend from the substrate to at least a side face of the active layer. In the embedded layer, (0-11)-plane growth region of the side face of the active layer is higher than (311)B-plane growth region on the semiconductor substrate in active Fe concentration. |
申请公布号 |
JP2015233093(A) |
申请公布日期 |
2015.12.24 |
申请号 |
JP20140119744 |
申请日期 |
2014.06.10 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
MORI DAIKI;TANAHASHI TOSHIYUKI |
分类号 |
H01S5/227;H01S5/323 |
主分类号 |
H01S5/227 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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