发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide: a semiconductor device which enables the suppression of the worsening of embedded layer's crystallinity, and the enhancement of the property of a breakdown voltage; and a method for manufacturing such a semiconductor device.SOLUTION: A semiconductor device comprises: a semiconductor substrate; a mesa provided on the semiconductor substrate and including an active layer; and an Fe-doped InP embedded layer formed on the semiconductor substrate so as to extend from the substrate to at least a side face of the active layer. In the embedded layer, (0-11)-plane growth region of the side face of the active layer is higher than (311)B-plane growth region on the semiconductor substrate in active Fe concentration.
申请公布号 JP2015233093(A) 申请公布日期 2015.12.24
申请号 JP20140119744 申请日期 2014.06.10
申请人 SUMITOMO ELECTRIC IND LTD 发明人 MORI DAIKI;TANAHASHI TOSHIYUKI
分类号 H01S5/227;H01S5/323 主分类号 H01S5/227
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