发明名称 DELAY TIME MEASUREMENT METHOD AND DELAY TIME MEASUREMENT DEVICE
摘要 PROBLEM TO BE SOLVED: To measure delay time while stabilizing operation of a circuit.SOLUTION: A delay time measurement device (1) comprises: a first flip flop (31a) connected to an input side of a combinational circuit (21); a delay part (32) connected to an output side of a combinational circuit (31) and delaying an output signal, and capable of controlling a delay amount of a signal on the delay part (32); a second flip flop (31b) connected to an output side of the delay part (32); and measurement means (5C) for measuring delay time of the combinational circuit (21) based on a delay amount when a signal outputted from the second flip flop (31b) becomes a value which is not a preset expectation value.
申请公布号 JP2015232531(A) 申请公布日期 2015.12.24
申请号 JP20140120117 申请日期 2014.06.11
申请人 TOKYO METROPOLITAN UNIV 发明人 MIURA YUKIYA
分类号 G01R31/28 主分类号 G01R31/28
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