| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide an optical characteristic unevenness measuring apparatus capable of quickly and accurately measuring unevenness of optical characteristics. <P>SOLUTION: An imaging part 110 simultaneously images LED light sources 211 arrayed on an LED mounting substrate 200-1 and respectively detects an x value and a y value of an XYZ display system as characteristic values of light made incident from each measuring point P. A personal computer corrects the optical characteristic values corresponding to each LED light source 211 to values corresponding to a reference radiation angle by using an angle correction matrix determined in accordance with the light radiation angle. Since the characteristic values of the LED light sources 211 are corrected in accordance with radiation angles, accurate optical characteristic values can be obtained though the plurality of LED light sources 211 are simultaneously imaged. <P>COPYRIGHT: (C)2013,JPO&INPIT</p> |
