发明名称 ALPHA RAY OBSERVATION DEVICE, ALPHA RAY OBSERVATION SYSTEM, AND ALPHA RAY OBSERVATION METHOD
摘要 An alpha ray observation apparatus (200), according to an embodiment, that observes alpha rays by detecting alpha-ray-caused light generated from an alpha ray source in a to-be-observed object, has: an alpha-ray-caused light wavelength selecting unit (1a) that can select light including wavelength of the alpha-ray-caused light; an alpha-ray-caused light detecting unit (2a) that measures an amount of alpha-ray-caused light; a short-side wavelength selecting unit (1b) that can select light of a short-side wavelength that is shorter than the wavelength of the alpha-ray-caused light; a short-side wavelength light detecting unit (2b); a long-side wavelength selecting unit (1c) that can select light of a long-side wavelength that longer than the wavelength of the alpha-ray-caused light; a long-side wavelength light detecting unit (2c); and a correction unit (4) that calculates a corrected light amount by correcting the amount of the alpha-ray-caused light.
申请公布号 EP2957929(A1) 申请公布日期 2015.12.23
申请号 EP20140750989 申请日期 2014.02.12
申请人 KABUSHIKI KAISHA TOSHIBA, INC. 发明人 KUME, NAOTO;KURODA, HIDEHIKO;NAKAYAMA, KUNIHIKO;TAKAKURA, KEI
分类号 G01T1/205;G01T1/17;G01T1/20 主分类号 G01T1/205
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