发明名称 |
ALPHA RAY OBSERVATION DEVICE, ALPHA RAY OBSERVATION SYSTEM, AND ALPHA RAY OBSERVATION METHOD |
摘要 |
An alpha ray observation apparatus (200), according to an embodiment, that observes alpha rays by detecting alpha-ray-caused light generated from an alpha ray source in a to-be-observed object, has: an alpha-ray-caused light wavelength selecting unit (1a) that can select light including wavelength of the alpha-ray-caused light; an alpha-ray-caused light detecting unit (2a) that measures an amount of alpha-ray-caused light; a short-side wavelength selecting unit (1b) that can select light of a short-side wavelength that is shorter than the wavelength of the alpha-ray-caused light; a short-side wavelength light detecting unit (2b); a long-side wavelength selecting unit (1c) that can select light of a long-side wavelength that longer than the wavelength of the alpha-ray-caused light; a long-side wavelength light detecting unit (2c); and a correction unit (4) that calculates a corrected light amount by correcting the amount of the alpha-ray-caused light. |
申请公布号 |
EP2957929(A1) |
申请公布日期 |
2015.12.23 |
申请号 |
EP20140750989 |
申请日期 |
2014.02.12 |
申请人 |
KABUSHIKI KAISHA TOSHIBA, INC. |
发明人 |
KUME, NAOTO;KURODA, HIDEHIKO;NAKAYAMA, KUNIHIKO;TAKAKURA, KEI |
分类号 |
G01T1/205;G01T1/17;G01T1/20 |
主分类号 |
G01T1/205 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|