发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SEMICONDUCTOR DEVICE |
摘要 |
In order to enable more preferable manufacturing of a structure in which a high-concentration impurity region, a medium-concentration impurity region, and a low-concentration impurity region are disposed from a surface side of a substrate, a method for manufacturing a semiconductor device (10) has: a first injection step of injecting a first conductivity-type impurity from a surface (12b) of a semiconductor substrate (12) of a first conductivity type into said semiconductor substrate (12); a step of melting and then solidifying a first semiconductor region (52) from a specific depth (13b) to said surface (12b), said specific depth (13b) being deeper than a peak concentration depth (13a) of the first conductivity-type impurity in a rising region (50) in which the first conductivity-type impurity concentration has risen in said first injection step and shallower than a deep side end (13c) of said rising region (50); a second injection step of injecting the first conductivity-type impurity from said surface (12b) into a region shallower than said specific depth (13b); and a step of melting and then solidifying a region where the first conductivity-type impurity concentration has risen in said second injection step. |
申请公布号 |
WO2015194250(A1) |
申请公布日期 |
2015.12.23 |
申请号 |
WO2015JP62016 |
申请日期 |
2015.04.20 |
申请人 |
TOYOTA JIDOSHA KABUSHIKI KAISHA |
发明人 |
HORIUCHI YUKI;KAMEYAMA SATORU |
分类号 |
H01L21/265;H01L21/329;H01L29/861;H01L29/868 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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