发明名称 SYSTEM AND METHOD FOR DETERMINING X-RAY EXPOSURE PARAMETERS
摘要 In accordance with one aspect of the present system, an X-ray detector of an X-ray imaging system includes a communication module configured to receive a pre-shot image from a detection circuitry and receive one or more pre-shot parameters from a source controller of the X-ray imaging system. The X-ray detector further includes an analysis module configured to determine one or more image characteristics of the pre-shot image. The X-ray detector further includes a determination module configured to calculate one or more main-shot parameters based on the one or more pre-shot parameters and the one or more image characteristics. The determination module is further configured to send the one or more main-shot parameters to the source controller of the X-ray imaging system.
申请公布号 WO2015195515(A2) 申请公布日期 2015.12.23
申请号 WO2015US35760 申请日期 2015.06.15
申请人 GENERAL ELECTRIC COMPANY 发明人 ZOU, YUN;SAUNDERS, ROWLAND FREDERICK;ZELAKIEWICZ, SCOTT STEPHEN;HEUKENSFELDT JANSEN, FLORIBERTUS P.M.;FRONTERA, MARK ALAN;WIEDMANN, UWE;WALIMBE, VIVEK
分类号 A61B6/00 主分类号 A61B6/00
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