发明名称 MATHEMATICAL IMAGE ASSEMBLY IN A SCANNING-TYPE MICROSCOPE
摘要 A method of accumulating an image of a specimen using a scanning-type microscope, comprising the following steps: - Providing a beam of radiation that is directed from a source through an illuminator so as to irradiate the specimen; - Providing a detector for detecting a flux of radiation emanating from the specimen in response to said irradiation; - Causing said beam to undergo scanning motion relative to a surface of the specimen, and recording an output of the detector as a function of scan position, which method additionally comprises the following steps: - In a first sampling session S 1 , gathering detector data from a first collection P 1 of sampling points distributed sparsely across the specimen; - Repeating this procedure so as to accumulate a set {P n } of such collections, gathered during an associated set {S n } of sampling sessions, each set with a cardinality N > 1; - Assembling an image of the specimen by using the set {P n } as input to an integrative mathematical reconstruction procedure, wherein, as part of said assembly process, a mathematical registration correction is made to compensate for drift mismatches between different members of the set {P n }.
申请公布号 EP2958131(A1) 申请公布日期 2015.12.23
申请号 EP20150172227 申请日期 2015.06.16
申请人 FEI COMPANY 发明人 POTOCEK, PAVEL;KOOIJMAN, CORNELIS;SLINGERLAND, HENDRIK;VEEN, VAN, GERARD;BOUGHORBEL, FAYSAL
分类号 H01J37/22;G02B21/00;H01J37/28 主分类号 H01J37/22
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