Imaging system with defocused and aperture-cropped light sources for detecting surface characteristics

摘要

A system for detecting characteristics of a surface includes multiple sources of lights, a platform structure configured to support the surface, a lens aligned with the platform structure, a cropping aperture, and an image receiver. The platform structure is configured to receive light from the source of light and the lens is positioned such that the source of light is not in focus, but the detected surface is in focus. The cropping aperture is configured to crop light reflected from the surface, and the image receiver is configured to receive the light conditioned by the cropping aperture.

主权项

1. A system for detecting crack, tilt, and warping of a reflective surface, comprising:
an array of a plurality of light sources; a platform structure configured to hold the surface such that the surface is configured to receive light from the light sources; an image receiver configured to acquire an image that includes a plurality of individual reflected light spots; a lens aligned with the platform structure, wherein the lens is positioned such that the reflected light spots in the image are not in focus, but the surface is in focus; a cropping aperture configured to crop each reflected light spot in the image reflected from the surface, wherein the cropping aperture and the image receiver are configured such that each of the reflected light spots in the image have a shape that is defined by the cropping aperture.