发明名称 LITHOGRAPHY APPARATUS, AND METHOD OF MANUFACTURING ARTICLE
摘要 The present invention provides a lithography apparatus which sequentially irradiates a beam to a first region and a second region having a common stitching region on a substrate in order to form a pattern on the substrate. The apparatus includes a processor configured to provide a weight value to first location information of the second region before the beam is irradiated to the first region and to the second location information of the second region after the irradiation individually in order to obtain location information of the second region.
申请公布号 KR20150142607(A) 申请公布日期 2015.12.22
申请号 KR20150079024 申请日期 2015.06.04
申请人 CANON KABUSHIKI KAISHA 发明人 OGAWA SHIGEKI;INA HIDEKI
分类号 H01L21/027;H01L21/66;H01L23/544 主分类号 H01L21/027
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