Co-facial analytical test strip with stacked unidirectional contact pads

摘要

An analytical test strip (“ATT”) for use with a test meter includes a first insulating layer, with a first insulating layer upper surface, and a first electrically conductive layer (“ECL”) disposed thereon. The first ECL includes a first electrode portion (“EP”) and an electrical contact pad in electrical communication with the first EP. The ATT also includes a patterned spacer layer disposed above the first ECL that includes (i) a distal portion defining a bodily fluid sample-receiving chamber therein that overlies the first EP and (ii) an insulating proximal portion with an upper surface having a second ECL disposed thereon. The second ECL includes an interlayer contact portion and an electrical contact pad. A third ECL of the ATT includes a second EP and a proximal portion that overlies the interlayer contact portion. The second EP is disposed overlying and exposed to the sample-receiving chamber in an opposing relationship to the first EP.

主权项

1. An analytical test strip, for use with a test meter, the analytical test strip comprising:
a first insulating layer with a first insulating layer upper surface; a first electrically conductive layer disposed on the first insulating layer upper surface and including:
a first electrode portion; andat least one electrical contact pad in electrical communication with the first electrode portion; a patterned spacer layer disposed above the first electrically conductive layer and including:
a distal portion defining a bodily fluid sample-receiving chamber therein that overlies the first electrode portion; andan insulating proximal portion with an upper surface and a second electrically conductive layer disposed thereon, the second electrically conductive layer including:
an interlayer contact portion; andan electrical contact pad; a second insulating layer disposed above the patterned spacer layer and having a second insulating layer lower surface; a third electrically conductive layer disposed on the third insulating layer lower surface and including:
a second electrode portion; anda proximal portion overlying the interlayer contact portion, wherein the second electrode portion is disposed overlying and exposed to the sample-receiving chamber and in an opposing relationship to the first electrode portion, wherein the proximal portion of the third electrically conductive layer is operatively juxtaposed with the interlayer contact portion of the second electrically conductive layer such that there is an electrical connection between the second electrode portion of the third electrically conductive layer and the electrical contact pad of the patterned spacer layer during use of the analytical test strip, wherein the analytical test strip includes a first integrated carrier sheet and a second integrated carrier sheet, and wherein at least a portion of the first insulating layer, first electrically conductive layer, patterned spacer layer, second insulating layer and second electrically conductive layer are disposed between the first integrated carrier sheet and the second integrated carrier sheet.