发明名称 WAFER PROCESSING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a wafer processing method that adhesively attaches a protection tape to the surface of a wafer having a reformed layer formed along a parting scheduled line, and grinds the back surface of the wafer with grinding water while supplying the grinding water, thereby setting thickness of the wafer to a predetermined thickness, thereby preventing pollution of the side surface and front surface of each device when the wafer is parted into individual devices.SOLUTION: A wafer processing method comprises a reformed layer forming step of irradiating a laser beam having a wavelength transmissible through a wafer 2 along a parting scheduled line while the focal point of the laser beam is located inside the wafer 2, thereby forming a reformed layer along the parting scheduled line inside the wafer, and a back surface grinding step of grinding the back surface 2b of the wafer while supplying grinding water, thereby setting the thickness of the wafer to a predetermined thickness, and parting the wafer into individual devices along the parting scheduled line with the reforming layer set as a breaking starting point. A protection film forming step of coating liquid resin on the surface of the wafer to form a protection film 300, and a protection tape attaching step of adhesively attaching a protection tape 4 to the surface of the protection film are executed before the back surface grinding step is executed.
申请公布号 JP2015230964(A) 申请公布日期 2015.12.21
申请号 JP20140116412 申请日期 2014.06.05
申请人 DISCO ABRASIVE SYST LTD 发明人 NAKAMURA MASARU
分类号 H01L21/301;B23K26/53;H01L21/304 主分类号 H01L21/301
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