发明名称 HYSTERESIS CHARACTERISTIC DETECTION METHOD FOR COMPARISON CIRCUIT, AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To easily detect the hysteresis characteristic of a comparison circuit.SOLUTION: A control unit 4 controls an offset adjustment unit 3, which adjusts an offset amount of a comparison circuit 2, to change the offset amount from a value (max) to a value (min) to detect a value off1 at the change of an output signal logic level of the comparison circuit 2, and to change the offset amount from the value (min) to the value (max) to detect a value off2 at the change of the logic level, so as to detect the hysteresis characteristic of the comparison circuit 2 on the basis of a difference (off2-off1) between the value off1 and the value off2.
申请公布号 JP2015231112(A) 申请公布日期 2015.12.21
申请号 JP20140115974 申请日期 2014.06.04
申请人 FUJITSU LTD 发明人 CHEN YANFEI
分类号 H03K5/08 主分类号 H03K5/08
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