发明名称 STRESS MEASUREMENT SYSTEM AND STRESS MEASUREMENT METHOD
摘要 PROBLEM TO BE SOLVED: To improve the accuracy of stress measurement in order to measure stress which is generated at a measurement object on the basis of data which are obtained by an infrared camera by removing unnecessary components from the data.SOLUTION: A processor 30 performs the processing of first time series data P1 which are obtained by an infrared camera 21, and indicate a temporal change of a temperature of a measurement object. The processor 30 creates second frequency data S2 by filter-processing first frequency data S1 which are obtained by applying Fourier-transformation processing to first time series data P1. The second time series data P2 obtained from the second frequency data S2 by inverse Fourier-transformation processing are converted to stress data indicating stress which is generated at the measurement object. In the filter processing, data of frequencies which correspond to a fundamental frequency F0 indicating a stress generation frequency generated at the measurement object which is obtained by a geometric calculation, and also correspond to high-order frequencies F1, F2 of the integral multiplication of the fundamental frequency F0 are derived from the first frequency data S1.
申请公布号 JP2015230277(A) 申请公布日期 2015.12.21
申请号 JP20140117577 申请日期 2014.06.06
申请人 JTEKT CORP 发明人 OKUBO YUSUKE;HARUYAMA TOMOHIKO
分类号 G01L1/00 主分类号 G01L1/00
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