APPARATUS FOR TESTING ELECTRONIC COMPONENT AND TEST HANDLER FOR ELECTRONIC COMPONENT

摘要

The present invention relates to an apparatus for testing an electronic component and an electronic component handler. The apparatus for testing an electronic component includes: a first measurement unit for testing capacitance resulting from application of voltage to an electronic component for performing a test on the inside of the electronic component; a joining unit to which the first measurement unit is rotatably joined; and a test mode conversion unit for rotating the first measurement unit to convert a first test mode for measuring capacitance while the first measurement unit faces a first direction to a second test mode for measuring capacitance while the first measurement unit faces a second direction different from the first direction and vice versa.